Thickness and flaw detection using time mapping into memory tech

Details Thickness and flaw detection using time mapping into memory tech Thickness and flaw detection using time mapping into memory tech

1991-01-02

1992-12-01

Pihulic, Daniel T.

Communications, electrical: acoustic wave systems and devices

Acoustic image conversion

With memory means

73606, G03B 4206

Patent

active

051684691

ABSTRACT:
The invention pertains generally to ultrasonic imaging systems and is more particularly directed to use of such systems for nondestructive testing to measure the thickness of parts, or to examine parts suspected of having internal flaws but where access is often limited to the external surfaces. The invention makes thickness and flaw determinations of substantial accuracy without resulting to use of an expensive ultra high frequency clock to measure time.

REFERENCES:
patent: 4365320 (1982-12-01), Beauducel et al.
patent: 4890266 (1989-12-01), Woodward

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