Powered testing of mixed conventional/boundary-scan logic

Details Powered testing of mixed conventional/boundary-scan logic Powered testing of mixed conventional/boundary-scan logic

1993-11-22

1995-09-05

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 223, G01R 3128

Patent

active

054481660

ABSTRACT:
A method for testing a circuit board having both boundary-scan and non-boundary-scan devices is provided. The test method distinguishes boundary-scan nodes from non-boundary-scan nodes and uses cartesian coordinates (X,Y) of every pin of every device on the circuit board to determine a number of sets of non-boundary-scan nodes that are within a predetermined distance "R" from a device pin coupled to a boundary-scan node. The number of sets of non-boundary-scan nodes are grouped into "independent" groups which can be tested in parallel. A test cycle is performed by testing independent non-boundary-scan nodes in parallel by forcing drivers in the boundary-scan devices to a first logic state, and forcing each of the non-boundary-scan nodes to another logic state for a brief interval. Receivers on the boundary-scan devices capture a response vector during the brief interval, which is scanned out of the circuit board for evaluation. The response vector reflects which of the nodes has failed, and cartesian coordinate data giving the precise location of any faulty node(s) is returned to user.

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