Semiconductor memory device having redundancy configuration with

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365200, G06F 1120

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047837810

ABSTRACT:
A semiconductor memory device having a redundancy configuration including a read circuit for a defective memory address. The read circuit includes a transistor which forms a current switch circuit with a bipolar-transistor of an input buffer circuit. The base electrode of the transistor is connected to the output terminal of a PROM which stores a defective address. The reading operation is carried out by applying a voltage lower than a normally applied voltage to the base electrode of the bipolar-transistor and detecting the base current.

REFERENCES:
patent: 4583179 (1986-04-01), Horii
patent: 4592024 (1986-05-01), Sakai
patent: 4635232 (1987-01-01), Iwahashi
patent: 4656609 (1987-04-01), Higuchi

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