Plasma ion source mass spectrometer

Details Plasma ion source mass spectrometer Plasma ion source mass spectrometer

1989-06-06

1990-08-14

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, 250289, H01J 4926

Patent

active

049489623

ABSTRACT:
Disclosed is a plasma ion source mass spectrometer comprising an ion source in which a sample to be detected is ionized in plasma and a mass spectrometer which mass-separates and detects the ionized sample supplied from the ion source, characterized in that there is provided a gas introduction means for introducing into a region before the mass spectrometer a gas containing particles which can bring about a charge transfer reaction with background ions contained in particles supplied from the ion source or a gas containing particles which can bring about an energy transfer reaction with excited molecule contained in the particles supplied from the ion source. By providing such gas introduction means, background ions or excited molecule can be efficiently quenched and enhancement of sensitivity of plasma ion source mass spectrometer can be attained.

REFERENCES:
patent: 4144451 (1979-03-01), Kambara
patent: 4501965 (1985-02-01), Douglas
patent: 4682026 (1987-07-01), Douglas
patent: 4740696 (1988-04-01), Osawa et al.
patent: 4769540 (1988-09-01), Mitsui et al.
"Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements", Houk et al., Anal. Chem., 52, 1980, pp. 2283-2289.
"Use of the Microwave-Induced Nitrogen Discharge at Atmospheric Pressure as an Ion Source for Elemetal Mass Spectrometry", Wilson et al., Anal. Chem., 59, 1987, pp. 1664-1670.

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