Light wave interference length-measuring apparatus

Details Light wave interference length-measuring apparatus Light wave interference length-measuring apparatus

1988-10-13

1990-08-14

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

049482548

ABSTRACT:
An apparatus for measuring displacement by light wave interference, wherein means are provided to determine true displacement in spite of atmospheric flicker in the light path. Two coherent light beams of different wavelengths are transmitted over a common path and reflected from a light reflector means, the displacement of which is to be measured. The reflected beams are separated and compared with reference beams to measure a phase difference for each reflected beam, and signal processing means is provided for calculating atmospheric flicker error from the phase differences, and for determining true displacement by taking the measured error into consideration.

REFERENCES:
patent: 4377036 (1983-03-01), Dangschat
patent: 4378160 (1983-03-01), Vlad et al.
patent: 4643577 (1987-02-01), Roeth et al.
"Two-Laser Optical Distance-Measuring Instrument that Corrects for the Atmospheric Index of Refraction", Earnshaw et al, Applied Optics, Apr. 1972, vol. 11, No. 4, pp. 749-755.

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