Measuring system incorporating self-testing probe circuit and me

Details Measuring system incorporating self-testing probe circuit and me Measuring system incorporating self-testing probe circuit and me

1979-11-14

1981-05-26

Krass, Errol A.

Boots, shoes, and leggings

324 73R, 364481, 364580, 371 15, 371 25, G01R 3100

Patent

active

042701783

ABSTRACT:
In a system which measures a parameter of a sample and displays information relating thereto, a circuit including the component elements of the system for testing signal levels at test points within the system and for displaying the test signal levels. Switching means places the system in either a transducing mode for measuring the parameter or in a combined transducing/self-testing mode for simultaneous testing during transducing operation. The testing circuit includes an operator manipulated probe for contacting any of the test points and an analog multiplexer input of the system for multiplexing the probe test signal and the transducing signal. The multiplexed signals are converted to digital form and processed by the system's computer for display. In the combined transducing/self-testing mode, the probe test signal information is outputted to the system display while the transducing output thereto is inhibited. The transducing output information derived during testing is processed and stored by the computer for subsequent display.

REFERENCES:
patent: 3739160 (1973-06-01), El-Hasan et al.
patent: 3790767 (1974-02-01), Alexander
patent: 3835701 (1974-09-01), Murphy et al.
patent: 4035621 (1977-07-01), Kemp
patent: 4044244 (1977-08-01), Foreman et al.

Affiliated with

Also associated with

Rating

Measuring system incorporating self-testing probe circuit and me does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring system incorporating self-testing probe circuit and me, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring system incorporating self-testing probe circuit and me will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-456341