Apparatus for determining the effective surface roughness of pol

Details Apparatus for determining the effective surface roughness of pol Apparatus for determining the effective surface roughness of pol

1989-09-15

1990-11-20

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250228, 356236, G01N 2147

Patent

active

049720929

ABSTRACT:
Apparatus for determining the effective surface roughness of polished optical samples, by measuring the total integrated scattering, only operates for non-light-transmissive samples. For a transmissive sample, the invention adds a light trap behind the sample for transmitted light, and a diaphragm in front of the sample. The rear surface of the diaphragm is provided with a non-reflective wafing which traps secondary light reflected or scattered by the inside rear surface of the sample.

REFERENCES:
patent: 3874799 (1975-04-01), Isaacs et al.
patent: 4703187 (1987-10-01), Hofling et al.
Optik, 65 No. 2 (1983), pp. 143-151.
Applied Optics, vol. 23, No. 21, Nov. 1, 1984, pp. 3820-3825.
American Society for Testing Materials, ASTM Designation: F1048-87, Standard Test Method for Measuring the Effective Surface Roughness of Optic Components by Total Integrated Scattering.

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