Method of forming a high density vertical stud titanium silicide

Fishing – trapping – and vermin destroying

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29589, 29591, 357 67, 156643, 156653, H01L 2128

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active

047151099

ABSTRACT:
The disclosure relates to the formation of reachup contacts for VLSI integrated circuit interconnects wherein studs are formed of a conducting material which reaches up through subsequently applied insulating films or the like to contact metal patterns. The reachup contacts are fabricated using LPCVD polycrystalline silicon as a refill in etched apertures in an insulating layer with a titanium or other appropriate material over the silicon layer with subsequent reaction of the silicon layer and the titanium layer to form temperature resistant studs of titanium silicide.

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patent: 4545852 (1985-10-01), Barton
J. R. Kitcher, "Integral Stud for Multilevel Metal" in IBM Tech. Disc. Bull., vol. 23, No. 4, Sep. 1980, p. 1395.
T. A. Bartush, "Dual Dielectric for Multilevel Metal" in IBM Tech. Disc. Bull., vol. 23, No. 9, Feb. 1981, p. 4140.
J. R. Kitcher, "Reactive Ion Etch Process for Metal Wiring . . . " in IBM Tech. Disc. Bull., vol. 23, No. 4, Sep. 1980, p. 1394.

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