1989-03-02
1990-09-04
Hille, Rolf
357 39, 357 15, H01L 2974
Patent
active
049548697
ABSTRACT:
In an n-channel MCT (MOS-controlled thyristor), the p-doped channel region and the n.sup.+ -doped drain region are replaced by an n-doped combined channel-drain region (13) in the MOSFET structure of the switchable cathode short-circuits.
The resulting MOSFET structure of the depletion type results in latch-up immunity for the component and makes possible a simple optimization of the current level which can be switched off as a maximum.
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V. A. K. Temple, IEEE Trans. Electron Dev., vol. ED-33, pp. 1609-1618 (1986).
M. Stoisiek, et al., IEEE Int. Electron Dev. Meet. Techn. Dig., pp. 158-161 (1985).
M. Stoisiek, et al., Advances in Solid State Physics, vol. 26, pp. 361-373, F. Vieweg & Sons, Braunschweig/Wiesbaden (1986).
C. Turchetti, et al., IEEE Trans. Electron Dev., vol. ED-32, pp. 773-782 (1985).
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Siemens Forschungs-und Entwicklungsberichte, vol. 14, No. 2, 1985 (Berlin, DE), M. Stoisiek, et al., pp. 45-49.
Asea Brown Boveri Ltd.
Hille Rolf
Loke Steven
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