Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1986-11-26
1988-03-22
LaRoche, Eugene R.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01J 300
Patent
active
047324821
ABSTRACT:
To reduce the data rate of a digitalized measuring signal produced in Fourier spectroscopy, the analog signal representing the interferogram is mixed with a second electrical signal whose frequency is modulated in proportion to the deviation of the instantaneous actual speed of the moving mirror of a double beam interferometer from its constant desired speed. Only the difference frequencies produced as a result of the frequency mixing are digitalized and supplied to an associated computer for analysis of the interferogram. The digital measuring signal thus obtained is distinguished by a substantially reduced data rate without giving rise to additional errors in the frequency transformation. To produce the second frequency modulated electrical signal, a laser source is used which supplies a laser beam into the interferometer parallel to the measuring beam. The interferogram of the laser beam produced in the interferometer is converted by a second optoelectrical converter into an electrical signal frequency modulated in a desired manner and is supplied to a frequency mixer.
REFERENCES:
patent: 4193693 (1980-03-01), Schindler
patent: 4575246 (1986-03-01), Nishizawa et al.
Kayser-Threde GmbH
LaRoche Eugene R.
Pascal Robert J.
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