Device and a method for estimating transistor parameter...

Details Device and a method for estimating transistor parameter... Device and a method for estimating transistor parameter...

2006-02-01

2011-11-15

Nghiem, Michael (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S065000, C702S179000

Reexamination Certificate

active

08060324

ABSTRACT:
A method and a device for estimating parameter variations of transistors that belong to the same circuit. The method includes: providing the first circuit; providing a test circuit adapted to perform a first function and a stacked test circuit adapted to perform a second function that substantially equals the first function; wherein the test circuit, the stacked test circuit and the first circuit are processed under substantially the same processing conditions; determining a relationship between a parameter of the test circuit and a parameter of the stacked test circuit; and estimating parameter variations of transistors that belong to the first circuit in response to the determined relationship.

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patent: 58108769 (1983-06-01), None

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