Probe testing structure

Details Probe testing structure Probe testing structure

2007-06-20

2011-11-29

Kim, Robert (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Calibration aspect, e.g., calibration of probes

C850S020000

Reexamination Certificate

active

08069491

ABSTRACT:
A calibration structure for probing devices.

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