Method of fabricating capacitor in semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S295000, C257S296000, C257S306000, C257SE21009

Reexamination Certificate

active

08035193

ABSTRACT:
A capacitor includes a bottom electrode, a dielectric layer and a top electrode over a substrate. A RuXTiYOZfilm is included in at least one of the bottom and top electrodes, where x, y and z are positive real numbers. A method of fabricating the capacitor through a sequential formation of a bottom electrode, a dielectric layer and a top electrode over a substrate includes forming a RuXTiYOZfilm during a formation of at least one of the bottom electrode and top electrode, where x, y and z are positive real numbers.

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Korean Office Action for Korean patent application No. 10-2008-0035965.
Korean Notice of Allowance for application No. 10-2008-0035965.

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