Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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Details

Other Related Categories

C257S295000, C257SE21008, C257SE29343

Type

Reexamination Certificate

Status

active

Patent number

08067817

Description

ABSTRACT:
A semiconductor device includes a ferroelectric capacitor formed over a semiconductor substrate, wherein the ferroelectric capacitor including a lower electrode, a ferroelectric film formed on the lower electrode, and an upper electrode formed on the ferroelectric film, and the upper electrode including a first conductive film formed of a first conductive noble metal oxide, and a second conductive film formed of a metal nitride compound formed on the first conductive film.

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patent: 2003-152165 (2003-05-01), None
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patent: 2006-032451 (2006-02-01), None
International Search Report of PCT/JP2007/055053, date of mailing Aug. 28, 2007.
Chinese Office Action dated Apr. 29, 2011 from the Chinese State Intellectual Property Office in a counterpart Chinese Patent Application No. 200780052165.1.

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