Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2011-04-13
2011-10-25
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
08045160
ABSTRACT:
Alignment marks12a,12b,12c, and12dare formed on the flat plane11aof the peripheral edge portion11formed integrally with the diffracting layer8, and when the lens portion7is mounted onto the substrate2, these alignment marks12a,12b,12cand12dare positioned to the substrate2, thereby making exact alignment of the diffracting layer8with respect to the light detecting portion4aof the light detecting element4, for example, not by depending on a difference in curvature radius of the lens portion7. In particular, the alignment marks12a,12b,12cand12dare formed on the flat plane11a, thereby image recognition is given to exactly detect positions of the alignment marks12a,12b,12cand12d, thus making it possible to make exact alignment.
REFERENCES:
patent: 2004/0239931 (2004-12-01), Teichmann et al.
patent: 2006/0139637 (2006-06-01), Cho et al.
patent: 4-294223 (1992-10-01), None
patent: 2004-354176 (2004-12-01), None
patent: 2005-172897 (2005-06-01), None
patent: 2005-308495 (2005-11-01), None
Hiller Dietmar
Shibayama Katsumi
Starker Ulrich
Suzuki Tomofumi
Teichmann Helmut
Drinker Biddle & Reath LLP
Evans F. L.
Hamamatsu Photonics K.K.
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