System and method for measuring display quality with a...

Optics: measuring and testing – By dispersed light spectroscopy

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S326000, C356S237100, C348S191000

Reexamination Certificate

active

08035812

ABSTRACT:
A system and method for measuring display quality by using a hyperspectral imager are disclosed. In one embodiment, the system comprises a hyperspectral imager configured to determine an intensity of light for a plurality of locations in a first area on a display for a plurality of spectral channels, and a processor configured to determine a measure of display quality based on the determined intensities.

REFERENCES:
patent: 5559358 (1996-09-01), Burns et al.
patent: 6040937 (2000-03-01), Miles
patent: 6077452 (2000-06-01), Litvak
patent: 6160541 (2000-12-01), Palalau et al.
patent: 6285207 (2001-09-01), Listwan
patent: 6567715 (2003-05-01), Sinclair et al.
patent: 6657218 (2003-12-01), Noda
patent: 6674562 (2004-01-01), Miles
patent: 6734977 (2004-05-01), Noda
patent: 6781702 (2004-08-01), Giannakopoulos et al.
patent: 6950193 (2005-09-01), Discenzo
patent: 7026821 (2006-04-01), Martin
patent: 7123216 (2006-10-01), Miles
patent: 7327510 (2008-02-01), Cummings et al.
patent: 7423287 (2008-09-01), U'Ren et al.
patent: 7580176 (2009-08-01), Cummings et al.
patent: 2004/0042000 (2004-03-01), Mehrl et al.
patent: 2005/0030551 (2005-02-01), Rosakis et al.
patent: 2005/0042777 (2005-02-01), Boger et al.
patent: 2006/0114243 (2006-06-01), Iwasaki
patent: 2006/0243023 (2006-11-01), Wong
patent: 2007/0201038 (2007-08-01), Cummings et al.
patent: 2009/0051369 (2009-02-01), Kogut et al.
patent: 2009/0201008 (2009-08-01), Govil
patent: 2009/0201009 (2009-08-01), Govil
patent: 2009/0201033 (2009-08-01), Govil
patent: 2009/0201034 (2009-08-01), Govil
patent: 2009/0204350 (2009-08-01), Govil et al.
patent: 2009/0207159 (2009-08-01), Govil
patent: 2009/0213107 (2009-08-01), Govil
patent: 2009/0251157 (2009-10-01), Govil
patent: 2009/0319218 (2009-12-01), Nachman et al.
patent: 2010/0321761 (2010-12-01), Cummings et al.
patent: 2 217 839 (1989-11-01), None
patent: WO 02/093116 (2002-11-01), None
Headwall Photonics, Application Note, Process Manufacturing—Hyperspectral Imaging, Document #AN2009-09, Jan. 2009, (retrieved Apr. 21, 2011 from http://www.headwallphotonics.com/downloads/app-notes/Process-Manufacturing-Headwall.pdf.
Barducci et al., 2007, Aerospace wetland monitoring by hyperspectral imaging sensors: a case study in the coastal zone of San Rossore Natural Park, Journal of Environmental Management, XXX:1-9.
Bashevoy et al., 2007, Hyperspectral imaging of plasmonic nanostructures with nanoscale resolution, Optics Express, 15(18):11313-11320.
Bonifazi et al., 2006, Hyperspectral imaging based techniques in fluff characterization, Advanced Environmental, Chemical, and Biological Sensing Technologies IV, Proc. of SPIE, 6377: 63770O-1-63770O-10.
Cobb et al., 2008, Innovative manufacturing and test technologies for imaging hyperspectral spectrometers, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII, Proc. of SPIE, 6233:62330R-1-62330R-9.
El Masry et al., 2007, Hyperspectral imaging for nondestructive determintaion of some qualify attributes for strawberry, Journal of Food Engineering, 81:98-107.
Gat, Mar. 1999, Directions in Environmental Spectroscopy, Spectroscopy Showcase, 2 pp.
Hartke et al.. Jan. 2007, Snapshot dual-band visible hyperspectral imaging spectrometer, Optical Engineering 46(1):013201-1-013201-7.
Ingram, 2008, Combining hyperspectral imaging and raman spectroscopy for remote chemical sensing, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sending IX, Proc. of SPIE, 6954: 695405-1-695405-7.
Ivanco et al., 2007, Real-time airborne hyperspectral imaging of land mines, Detection and Remediation Technologies for Mines and Minelike Targets XII, Proc. of SPIE, 6553:655315-1-655315-2.
Jusoff, 2008, Search and rescue (SAR) operations for the missing Bell 206 Long Ranger helicopter in Sarawak, Malaysia, using near real-time airborne hyperspectral imaging system, Disaster Prevention and Management, 17(1):94-103.
Liu et al., 2006, Development of simple algorithms for the detection of fecal contaminants on apples from visible
ear infrared hyperspectral reflectance imaging, Journal of Food Engineering, 81:412-418.
Luet et al., 2004, P-58: Imagining polization interferometer for flat panel display characterization, SID 04 Digest, pp. 466-469.
McFee et al., 2007, Landmine detection using passive hyperspectral imaging, Chemical and Biological Sensing III, Proc. of SPIE, 6554:655404-1-655404-2.
Smith, Randall, Jul. 14, 2006, “Introduction to Hyperspectral Imaging,” www.microimages.com/getstart/pdf/hyprspec.pdf, p. 1-24.
Mineo—User Need Document, 2002, Part 3: State of the art of remote sensing and GIS applied to environmental studies related to mining activities, 63 pp.
Pons-Nin et al., Jun. 2002, Voltage and pull-in time in current drive of electrostatic actuators, Journal of Microelectromechanical Systems, 11(3):196-205.
Qiao et al., 2007, Pork quality and marbling level assessment using a hyperspectral imaging system, Journal of Food Engineering, 83:10-16.
Qin et al., 2008, Measurement of the optical properties of fruits and vegetable using spatially resolved hyperspectral diffuse reflectance imaging technique, Postharvest Biology and Technology, 49:355-365.
Shlens, Jonathon, “A Tutorial on Principal Component Analysis,” http://www.snl.salk.edu/˜shlens/pca.pdf, Salk Institute for Biological Studies, Dec. 10, 2005, p. 1-13.
Smith, Lindsay, “A Tutorial on Principle Components Analysis,” http://www.cs.otago.ac.nz/cosc453/student—tutorials/principal—components.pdf, Univerity of Otago, Department of Computer Science, Feb. 26, 2002, p. 1-26.
Vo-Dinh et al., Sep. 2004, A hyperspectral imaging system for in vivo optical diagnostics, Engineering in Medicine and Biology Magazine, pp. 40-49.
Ye et al., 2008, A ground-based hyperspectral imaging system for characterizing vegetation spectral features, Computers and Electronics in Agriculture, 63:13-21.
Yiqun et al., 2007, Compact hyperspectral imaging system with a convex grating, Optical Design and Testing III, Proc. of SPIE, 6834:68340Y-1-68340Y-9.
Conner, “Hybrid Color Display Using Optical Interference Filter Array,” SID Digest, pp. 577-580 (1993).
Guckel et al., “Fine-Grained Polysilicon Films with Built-In Tensile Strain,” IEEE Transactions on Electron Devices, vol. 35, No. 6, pp. 801-802, (1988).
Jerman et al., “A Miniature Fabry-Perot Interferometer with a Corrugated Silicon Diaphragm Support,” IEEE Electron Devices Society (1988).
Lin et al., “A Micro Strain Gauge with Mechanical Amplifier,” J. of Microelectromechanical Systems, vol. 6, No. 4, (1997).
Miles, “MEMS-based interferometric modulator for display applications,” Proc. SPIE vol. 3876, pp. 20-28, Sep. 1999.
Miles, “5.3: Digital Paper™: Reflective Displays Using Interferometric Modulation,” SID 00 Digest, pp. 32-35 (2000).
Miles, 10.1: Digital PaperTM for Reflective Displays, SID 02 Digest, pp. 115-117 (2002).
Miles et al., “Digital Paper™ for Reflective Displays,” J. of the Society for Information Display Soc. Inf. Display USA. vol. 11, No. 1, p. 209-215. (2003).
Raley et al., “A Fabry-Perot Microinterferometer for Visible Wavelengths,” IEEE Solid-State Sensor and Actuator Workshop, Hilton Head, SC (1992).
Singh et al., “Strain Studies in LPCVD Polysilicon for Surface Micromachined Devices,”Sensors and Actuators, vol. 77, pp. 133-138, (1999).
Srikar et al., “A Critical Review of Microscale Mechanical Testing Methods Used in the Design of Microelectromechanical Systems,”Society for Experimental mechanics, vol. 43, No. 3, (2003).
van Drieenhuizen, et al., “Comparison of Techniques for measuring Both Compressive and Tensile Stress in Thin Films.” Sensors and Actuators, vol. 37-38, pp. 759-765. (1993).
Zhang, et al., “Measurements of Residual Stresses in Thin Films Using Micro-Rotating-Structures.” Thin Solid Films, vol. 335, pp. 97-105, (1998).
Castaner et al., Sep. 1999,

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for measuring display quality with a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for measuring display quality with a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring display quality with a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4274311

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.