Displacement measuring instrument and displacement measuring...

Optics: measuring and testing – By light interference – Having polarization

Reexamination Certificate

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Reexamination Certificate

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08081315

ABSTRACT:
A laser interferometric measuring instrument includes: a light source that emits a laser beam of 1064 nm and another laser beam of 532 nm; a polarizing beam splitter; a dichroic mirror that splits a long-wavelength laser beam provided in a measurement optical path; a long-wavelength corner cube that reflects the split laser beam; a measurement corner cube that is displaceable along the measurement optical path; a reference corner cube that is displaceable along a reference optical path; a optical path changing unit that changes an optical path length of the long-wavelength laser beam; a phase detector that outputs interference signals; a sum signal computer that calculates a sum signal; a displacement controller that displaces the reference corner cube so as not to change a phase of the sum signal; a reference displacement detector that detects a displacement of the reference corner cube; and a measurement displacement computer that calculates a displacement of the measurement corner cube.

REFERENCES:
patent: 5838485 (1998-11-01), de Groot et al.
patent: 5991033 (1999-11-01), Henshaw et al.
patent: 7864332 (2011-01-01), Chou
patent: A-5-272913 (1993-10-01), None
patent: A-7-49207 (1995-02-01), None
Banh Quoc et al., “Development of laser interferometer with picometer resolution using frequency tunable laser—The 5threport: Compensation of the displacement measurement due to the fluctuation of the air refractive index-”, collected papers for spring lecture of the Japan Society for Precision Engineering, 2008, pp. 441-442, vol. F—No. 02.
Ciddor, “Refractive index of air: new equations for the visible and near infrared,” Applied Optics, 1996, pp. 1566-1573, vol. 35—No. 9.
Hatsuzawa et al., “Precise Measurements of Micro-linewidths by using a Micro-Interferometer and a Scanning Electron Microscope,” 1994, pp. 1582-1585, vol. 60—No. 11 (with Abstract).

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