Phase-change memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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Details

C257S004000, C257SE45002

Reexamination Certificate

active

08049196

ABSTRACT:
A phase-change memory device includes a lower electrode; and at least two phase-change memory cells sharing the lower electrode. Another phase-change memory device includes a heating layer having a smaller contact area with a phase-change material layer and a greater contact area with a PN diode structure.

REFERENCES:
patent: 7002837 (2006-02-01), Morimoto
patent: 7166875 (2007-01-01), Gonzalez et al.
patent: 2003/0003691 (2003-01-01), Dennison et al.
patent: 2006/0108639 (2006-05-01), Cho et al.
patent: 2006/0151771 (2006-07-01), Asano et al.
patent: 2007/0091673 (2007-04-01), Asao et al.
patent: 2007/0249083 (2007-10-01), Li et al.
patent: 2008/0014733 (2008-01-01), Liu
patent: 2010/0061132 (2010-03-01), Fujisaki et al.
patent: 2007-288083 (2007-01-01), None
patent: 2007-035683 (2007-02-01), None
patent: 10-2009-0002548 (2009-01-01), None
English Translation of Korean Notice of Allowance for application No. 10-2008-0031473.
English Translation of Korean Office Action for Korean Patent Application No. 10-2008-0031473.

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