Voltage detection apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 96, G01R 31302

Patent

active

055834442

ABSTRACT:
This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

REFERENCES:
patent: 3102201 (1963-08-01), Braunstein et al.
patent: 3305685 (1967-02-01), Wang
patent: 3327243 (1967-06-01), Stickley
patent: 3458703 (1969-07-01), Migitaka
patent: 3461384 (1969-08-01), Bayati et al.
patent: 3477041 (1969-11-01), Steele et al.
patent: 3488586 (1970-01-01), Watrous et al.
patent: 3518574 (1970-06-01), Rutz
patent: 3614447 (1971-10-01), Paoli et al.
patent: 3680001 (1972-07-01), Paoli et al.
patent: 4229829 (1980-10-01), Grunwald
patent: 5357585 (1994-10-01), Kumar
Valdmanis et al., Subpicosecond Electrooptic Sampling: Principles and Applications IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.
Jewell et al., Vertical-Cavity Surface Emitting Lasers: Design, Growth, Fabrication, Characterization, Journal of Quantum Electronics, vol. 27, No. 6, Jun. 1991, pp. 1332-1346.
Kolner et al., Electrooptic Sampling in GaAs Integrated Circuits, IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 79-93.
Nagatsuma et al., Subpicosecond sampling using a noncontact electro-optic proble J. Appl. Phys. 66(9), Nov. 1989, pp. 4001-4009.
High Integrated Micro-Laser, Nikkei Science, vol. 1992, Jan., 1992, pp. 74-82.
Probe Measuring Technology and the Application Thereof, Sony Tektronic Inc., Nov. 1991, pp. 22-25.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Voltage detection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Voltage detection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage detection apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-426248

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.