Method and apparatus for distinguishing combinational designs

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing

Reexamination Certificate

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C716S106000, C716S111000, C716S112000, C703S002000

Reexamination Certificate

active

08074194

ABSTRACT:
Ordinary minterm counting (OMC) and weighted minterm counting (WMC) are applied as combinational design discriminators to a pair of combinational designs D1and D2. OMC assigns the same weight to each minterm, while WMC assigns a weight that can vary. For application of minterm counting, D1and D2can be converted into BDDs. The size of the BDDs can be reduced by assigning binary values to some of the input variables. If the minterm counts of D1and are within a certain tolerance, then D1and D2cannot be distinguished. Even if D1and D2are determined to represent different functionalities, they may still be sufficiently related such that classification of them as differing functionalities is inappropriate. Each such test of relatedness, between a pair of designs D1and D2, can be referred to as an “exception.” Minterm counting can also be applied when don't cares are part of a design specification. Exceptions can apply to such minterm counts.

REFERENCES:
patent: 6993730 (2006-01-01), Higgins
patent: 7240311 (2007-07-01), Lai
patent: 7386820 (2008-06-01), Koelbl et al.
patent: 2003/0131324 (2003-07-01), Takenaka
patent: 2004/0015799 (2004-01-01), Jain
patent: 2004/0177332 (2004-09-01), Pandey et al.
patent: 2005/0155002 (2005-07-01), Lai
patent: 2006/0156261 (2006-07-01), Farkash et al.
patent: 2006/0225008 (2006-10-01), Schleicher, II

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