Self-aligned memory cells and method for forming

Semiconductor device manufacturing: process – Making device array and selectively interconnecting

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S479000, C438S482000, C438S488000, C438S691000, C365S148000, C257S003000, C257S005000, C257S499000, C257SE31029

Reexamination Certificate

active

07838341

ABSTRACT:
The invention provides a memory cell based on variable resistance material memory element that includes an access device having a pillar structure that may also include a protective sidewall layer. The pillar access device selects and isolates the memory cell from other memory array cells and is adapted to both self-align any memory element formed thereon, and to deliver suitable programming current to the memory element. The pillar structure is formed from one or more access device layers stacked above a wordline and below the memory element. Optional resistive layers may be selectively formed within the pillar structure to minimize resistance in the access device layer and the memory element. The pillar access device may be a diode, transistor, Ovonic threshold switch or other device capable of regulating current flow to an overlying programmable memory material.

REFERENCES:
patent: 2008/0237566 (2008-10-01), An et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Self-aligned memory cells and method for forming does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-aligned memory cells and method for forming, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-aligned memory cells and method for forming will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4250491

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.