Power supply assembly and semiconductor testing system using...

Details Power supply assembly and semiconductor testing system using... Power supply assembly and semiconductor testing system using...

2007-05-21

2010-06-15

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S416000, C323S282000

Reexamination Certificate

active

07737718

ABSTRACT:
A power supply assembly that can be miniaturized even though an applied voltage to a load is rendered variable, and a semiconductor testing system using the same are put into practice. With an improvement of the power supply assembly for finding an error against a set voltage by feeding back an applied voltage applied to a load, and applying a predetermined voltage to the load by causing an output amplifier to increase and decrease amperage to be fed to the load on the basis of the error, it is characterized in provided a voltage converter causing a voltage level of a power supply voltage of the output amplifier to follow up a voltage level of the set voltage.

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Office Action dated Jan. 28, 2010 in Corresponding Taiwanese Patent Application No. 096116101.

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