Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-12-15
2010-11-23
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S765010
Reexamination Certificate
active
07839155
ABSTRACT:
Methods and apparatus for analyzing an integrated circuit are disclosed. An example method includes supplying power to an on-chip supply power regulator of integrated circuit, instructing the on-chip supply power regulator to output a circuit supply signal having a desired minimum voltage level for the integrated circuit, instructing the integrated circuit to initiate an on-chip self-test process, analyzing the results of the on-chip self-test process, and repeating the process after stepping down the voltage of the circuit supply signal level.
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Brady III Wade J.
Kempler William B.
Nguyen Ha Tran T
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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