Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-11-04
2010-12-14
Chang, Jon (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S218000, C382S286000, C382S118000
Reexamination Certificate
active
07853082
ABSTRACT:
A normal line information estimation device for estimating normal line information of an object from an image of the object. The normal line information estimation device includes an illumination direction estimation section for estimating an illumination direction with respect to the object in the image from a luminance value of the image; a normal line information estimation section for estimating the normal line information of the object in the image based on the illumination direction; and a specular reflection component estimation section for estimating a specular reflection component of the image from the normal line information of the object and the illumination direction with respect to the object. The normal line information estimation section estimates the normal line information again from the image from which a specular reflection component has been removed in the specular reflection component section.
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Nagao Kenji
Nagao, legal representative Etsuko
Shimano Mihoko
Chang Jon
Panasonic Corporation
RatnerPrestia
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