Plasma deposition apparatus and method for making...

Semiconductor device manufacturing: process – Chemical etching

Reexamination Certificate

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C422S186000

Reexamination Certificate

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07816269

ABSTRACT:
A plasma deposition apparatus for making polycrystalline silicon including a chamber for depositing said polycrystalline silicon, the chamber having an exhaust system for recovering un-deposited gases; a support located within the deposition chamber for holding a target substrate having a deposition surface, the deposition surface defining a deposition zone; at least one induction coupled plasma torch located within the deposition chamber and spaced apart from the support, the at least one induction coupled plasma torch producing a plasma flame that is substantially perpendicular to the deposition surface, the plasma flame defining a reaction zone for reacting at least one precursor gas source to produce the polycrystalline silicon for depositing a layer of the polycrystalline silicon the deposition surface.

REFERENCES:
patent: 6253580 (2001-07-01), Gouskov et al.
patent: 6686558 (2004-02-01), Selitser
patent: 7473443 (2009-01-01), Matsuki et al.
patent: 2003/0133853 (2003-07-01), Kelsey
patent: 2004/0115936 (2004-06-01), DePetrillo et al.
patent: 2005/0145163 (2005-07-01), Matsuki et al.
patent: 2009/0071404 (2009-03-01), Tada et al.
patent: 2009/0134120 (2009-05-01), Ohmi et al.
patent: 0 286 306 (1988-10-01), None
patent: 1 281 680 (2003-02-01), None
“Ultrafast deposition of microcrystalline Si by thermal plasma chemical vapor deposition”, Journal of Applied Physics, vol. 89, No. 12, Jun. 15, 2001.

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