Electrical, high temperature test probe with conductive...

Details Electrical, high temperature test probe with conductive... Electrical, high temperature test probe with conductive...

2007-08-09

2010-02-09

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07659737

ABSTRACT:
A probe needle apparatus and method provides a drive guard having the same potential as a probe needle for reducing signal noise in low current measurements. The probe needle apparatus includes a central conductive core covered with alternating layers of dielectric and conductive materials, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive drive guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core.

REFERENCES:
patent: 3787768 (1974-01-01), Kubota et al.
patent: 3963986 (1976-06-01), Morton et al.
patent: 4365109 (1982-12-01), O'Loughlin
patent: 4480223 (1984-10-01), Aigo
patent: 4667523 (1987-05-01), Becker et al.
patent: 4731577 (1988-03-01), Logan
patent: 4845426 (1989-07-01), Nolan et al.
patent: 5003254 (1991-03-01), Hunt et al.
patent: 5015947 (1991-05-01), Chism
patent: 5150040 (1992-09-01), Byrnes et al.
patent: 5151653 (1992-09-01), Yutori et al.
patent: 5168218 (1992-12-01), Rich
patent: 5192907 (1993-03-01), Bonaria
patent: 5196789 (1993-03-01), Golden et al.
patent: 5325052 (1994-06-01), Yamashita
patent: 5397996 (1995-03-01), Keezer
patent: 5473254 (1995-12-01), Asar
patent: 5486770 (1996-01-01), Johnson
patent: 5488292 (1996-01-01), Tsuta
patent: 5525911 (1996-06-01), Marumo et al.
patent: 5729150 (1998-03-01), Schwindt
patent: 5742174 (1998-04-01), Kister et al.
patent: 5952843 (1999-09-01), Vinh
patent: 6014032 (2000-01-01), Maddix et al.
patent: 6050829 (2000-04-01), Edridge et al.
patent: 6075376 (2000-06-01), Schwindt
patent: 6124723 (2000-09-01), Costello
patent: 6137302 (2000-10-01), Schwindt
patent: 6201402 (2001-03-01), Root
patent: 6232143 (2001-05-01), Maddix et al.
patent: 6275051 (2001-08-01), Bachelder et al.
patent: 6276956 (2001-08-01), Cook
patent: 6586954 (2003-07-01), Root
patent: 6603322 (2003-08-01), Boll et al.
patent: 6847219 (2005-01-01), Lesher et al.
patent: 6963207 (2005-11-01), Root et al.
patent: 6975128 (2005-12-01), Root et al.
patent: 7271607 (2007-09-01), Root et al.
patent: 7545157 (2009-06-01), Root et al.
patent: 2001/0011902 (2001-08-01), Schwindt
patent: 2005/0253612 (2005-11-01), Root et al.
patent: 2006/0114009 (2006-06-01), Root et al.
patent: 2007/0252606 (2007-11-01), Root et al.
patent: 0 177 809 (1986-04-01), None
patent: 06088906 (1994-03-01), None
patent: WO 99/04273 (1999-01-01), None

Affiliated with

Also associated with

Rating

Electrical, high temperature test probe with conductive... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrical, high temperature test probe with conductive..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical, high temperature test probe with conductive... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4223648