Test apparatus and test method for testing a device based on...

Details Test apparatus and test method for testing a device based on... Test apparatus and test method for testing a device based on...

2008-09-12

2010-12-28

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S763010

Reexamination Certificate

active

07859288

ABSTRACT:
Provided is A test apparatus that tests a device under test, including a power supply section that supplies power to a power supply terminal of the device under test; a power supply control section that controls the power supply section to output the power at a plurality of voltage levels; a current measuring section that measures, at each voltage level, a current value of a quiescent current of the device under test, the quiescent current being supplied to the power supply terminal of the device under test by the power supply section; and an analyzing section that analyzes whether a defect is present in the device under test by using at least three current values from among the current values measured by the current measuring section at the plurality of voltage levels.

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“Search Report of PCT counterpart application”, issued on Dec. 22, 2009, p. 1-p. 11.

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