Electronic device test system

Details Electronic device test system Electronic device test system

2006-07-13

2010-12-28

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07859286

ABSTRACT:
When the number of DUTs carried on a loader buffer and scheduled to be held by contact arms at the next test is less than N, a DUT at a contact arm corresponding to a missing position at the loader buffer among the N number of DUTs being held for execution of a current test is held as it is without being ejected. While holding this DUT, the DUTs carried at the loader buffer for execution of the next test are picked up and the test is executed in that state.

REFERENCES:
patent: 2001-033514 (2001-02-01), None
patent: 2002-207062 (2002-07-01), None
“Multi-Size Chip Alignment Fixture”; IBM Technical Disclosure Bulletin; vol. 37; No. 5; May 1, 1994; pp. 309-310.
English language Abstract of JP 2002-207062.
English language Abstract of JP 2001-033514.

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