Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement
Reexamination Certificate
2005-10-31
2010-12-14
Bhat, Aditya (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Position measurement
C073S105000
Reexamination Certificate
active
07853422
ABSTRACT:
The vibration characteristic of a dynamic AFM probe is simulated. For a given operation parameter (for example, the displacement u0of the probe, the spring constant k of the cantilever, or the radius of curvature of the probe R1), the plate-spring cantilever to which the probe is attached is vertically moved while being mechanically resonated, and the vibration characteristic of the probe of the dynamic mode atomic force microscope (AFM) for observing the structure of the sample surface is simulated. The vibration information on the probe in the steady state at each initial position u0(displacement u−time τ) (S103, S104) is recorded, and the movement of the probe is visualized by GUI on the basis of the recorded vibration information. An essential spectroscopy obtained by the AFM, for example the ampliture a−probe initial position u0relation or the interaction force F−probe initial position u0relation is determined and shown on a graph according to the approach/separation of the probe (cantilever) to/from the surface.
REFERENCES:
patent: 5503010 (1996-04-01), Yamanaka
patent: 06-117844 (1994-04-01), None
patent: 08-035831 (1996-02-01), None
patent: 10-293135 (1998-11-01), None
patent: 2000-028624 (2000-01-01), None
patent: 2002-181687 (2002-06-01), None
patent: 2003-065931 (2003-03-01), None
patent: 2003-065935 (2003-03-01), None
patent: 2005-069851 (2005-03-01), None
patent: WO 02/25246 (2002-03-01), None
patent: WO 2006/049120 (2006-05-01), None
PCT-Notification of Transmittal of copies of Translation of the International Preliminary Report on Patentability; International Application No. PCT/JP2005/019985; International filing Date Oct. 31, 2005.
Brian A. Todd et al., “Improved analysis of the time domain response of scanning force microscope cantilevers,” Journal of Applied Physics, vol. 88, No. 12, pp. 7321-7327 (2000).
Naruo Sasaki et al., “New Method for Noncontact Atomic Force Microscopy Image Simulations,” Japanese Journal of Applied Physics, vol. 38, pp. 192-194 (1999).
S.I. Lee et al., “Nonlinear dynamic perspectives on dynamic force microscopy,” Science Direct, Ultramicroscopy 97, pp. 185-198, Elsevier Service, B.V. (2003).
Masaru Tsukada et al., “Calculation science and Nanoscience,” Keisan Kagaku Kenkyu Center Symposium, 20 pages (2004).
Naruo Sasaki, “Genishi Kanriki Kenbikyo Simulator—Nano Rikigaku No Hyoka Tool,” Materials Science and Technology, vol. 41, No. 5, pp. 246-278 (2004).
B. Gotsmann et al., “Conservative and dissipative tip-sample interaction forces probed with dynamic AFM,” Physical Review B, vol. 60, No. 15, pp. 51-61, The American Physical Society (1999).
J. Tobik et al., “Simulation of tip-surface interactions in atomic force microscopy of an InP(110) surface with a Si tip,” Physical Review B, vol. 60, No. 16, pp. 639-644, The American Physical Society (1999).
Naruo Sasaki et al., “Atomic-scale friction image of graphite in atomic-force microscopy,” Physical Review B, vol. 54, No. 3, pp. 2138-2149, The American Physical Society (1996).
Michel Gauthier et al., “Interplay between Nonlinearity, Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy,” Physical Review Letters, vol. 89, No. 14, pp. 146104-1-4, The American Physical Society (2002).
Masaru Tsukada et al., “Hisesshoku Genshi Kanryoku Kenbikyo no Riron,” Solid State Physics, vol. 38, No. 4, pp. 257-268 & 300, Agune Technology Center (2003).
B. Anczykowski et al., “Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects,” Physical Review B, vol. 53, No. 23, pp. 15 485-488, The American Physical Society (1996).
N. Sasaki et al., “Dynamics of the cantilever in noncontact atomic force microscopy,” Appl. Phys. A, 66, pp. S287-S291, Materials Science & Processing, Springer-Verlag (1998).
Naruo Sasaki et al., “The Relation between Resonance Curves and Tip-surface Interaction Potential in Noncontact Atomic-Force Microscopy,” Japanese Journal of Applied Physics, vol. 37, pp. L533-L535, Publication Board, Japanese Journal of Applied Physics (1998).
N. Sasaki et al., “Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy,” Appl. Phys. A 72 (Suppl.) pp. S39-S42 (2001).
N. Sasaki et al., “Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM,” Applied Surface Science, vol. 140, pp. 339-344, Elsevier Science B.V. (1999).
International Search Report.
Sasaki Naruo
Takahashi Tadataka
Bhat Aditya
Japan Science and Technology Agency
Rader & Fishman & Grauer, PLLC
LandOfFree
Dynamic-mode atomic-force-microscope probe (Tip) vibration... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic-mode atomic-force-microscope probe (Tip) vibration..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic-mode atomic-force-microscope probe (Tip) vibration... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4205945