Scanning-probe techniques or apparatus; applications of scanning – Auxiliary means serving to assist or improve the scanning... – Non-spm analyzing devices – e.g. – scanning electron...
Reexamination Certificate
2006-01-26
2010-06-08
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Auxiliary means serving to assist or improve the scanning...
Non-spm analyzing devices, e.g., scanning electron...
C250S281000, C250S282000, C250S287000, C250S288000, C850S021000, C850S030000, C850S032000
Reexamination Certificate
active
07735146
ABSTRACT:
A system and method for analyzing and imaging a sample containing molecules of interest combines modified MALDI mass spectrometer and SNOM devices and techniques, and includes: (A) an atmospheric-pressure or near-atmospheric-pressure ionization region; (B) a sample holder for holding the sample; (C) a laser for illuminating said sample; (D) a mass spectrometer having at least one evacuated vacuum chamber; (E) an atmospheric pressure interface connecting said ionization region and said mass spectrometer; (F) a scanning near-field optical microscopy instrument comprising a near-field probe for scanning the sample; a vacuum capillary nozzle for sucking in particles which are desorbed by said laser, the nozzle being connected to an inlet orifice of said atmospheric pressure interface; a scanner platform connected to the sample holder, the platform being movable to a distance within a near-field distance of the probe; and a controller for maintaining distance information about a current distance between said probe and said sample; (G) a recording device for recording topography and mass spectrum measurements made during scanning of the sample with the near-field probe; (H) a plotting device for plotting said topography and mass spectrum measurements as separate x-y mappings; and (I) an imaging device for providing images of the x-y mappings.
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Kashanchi Fatah
Reeves Mark E.
Vertes Akos
Berman Jack I
Blank Rome LLP
Ippolito Rausch Nicole
The George Washington University
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