Secondary ion mass spectrometer

Radiant energy – Ionic separation or analysis – With sample supply means

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250309, 250396, H01J 4904

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active

048002739

ABSTRACT:
Secondary ion mass spectrometer system having an ion collection lens including three conical lens sections, aligned along an axis, deflection plates for dynamically deflecting an ion beam along this axis, wherein the combination of lens sections and deflection plates focus the ions at an entrance aperture of an ion energy spectrometer formed by two 90.degree. sectors of spherical arcuate plates, an ion deceleration lens, a quadrupole mass spectrometer, and an ion detector. In combination, the three conical lens sections accelerate ions from a specimen surface, decelerate these ions into an ion energy spectrometer for energy window matching to the quadrupole mass spectrometer, and focus the ions on the entrance aperture of the ion energy spectrometer.

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