Thermal measuring and testing – Thermal calibration system
Reexamination Certificate
2007-07-09
2010-06-08
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Thermal calibration system
C374S185000
Reexamination Certificate
active
07731417
ABSTRACT:
A PWM signal generation circuit in an IPM includes an amplification circuit amplifying a voltage across terminals of a temperature sensor, a comparison circuit generating a PWM signal based on a triangular wave signal and an output signal of the amplification circuit, and a correction circuit setting an amplification ratio of the amplification circuit such that a pulse width of the PWM signal is set to a reference pulse width in an adjustment mode in which a switching element is caused to have a reference temperature. Consequently, characteristic variations in the temperature sensor, the amplification circuit, and the like can be corrected, and the temperature of the switching element can be detected with high accuracy.
REFERENCES:
patent: 4395139 (1983-07-01), Namiki et al.
patent: 7044633 (2006-05-01), Clabes et al.
patent: 7075353 (2006-07-01), Wan et al.
patent: 7356426 (2008-04-01), Jain et al.
patent: 7417487 (2008-08-01), Mori
patent: 2008/0031304 (2008-02-01), Nishimura
patent: 2008/0135397 (2008-06-01), Ehrfeld et al.
patent: 2008/0291970 (2008-11-01), Franch et al.
patent: 2001-298160 (2001-10-01), None
patent: 2002-148288 (2002-05-01), None
patent: 2004-85384 (2004-03-01), None
Jagan Mirellys
Mitsubishi Electric Corporation
Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P
Verbitsky Gail
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