Periodic patterns and technique to control misalignment...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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C356S400000, C422S022000, C422S030000

Reexamination Certificate

active

07656528

ABSTRACT:
A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.

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