Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Reexamination Certificate
2008-08-06
2010-02-02
Lee, Hsien-ming (Department: 2823)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
C438S458000, C257S618000, C257SE23173, C257SE21522, C257SE21603
Reexamination Certificate
active
07655537
ABSTRACT:
A method of fabricating composite substrates by associating a transfer layer with an intermediate support to form an intermediate substrate of predetermined thickness with the transfer layer having a free surface; providing a sample carrier having a surface and a recess that has a depth that is approximate the same as the predetermined thickness of the intermediate substrate so that the transfer layer free surface is positioned flush with the sample carrier surface; providing a support layer both on the transfer layer free surface and on a portion of the sample carrier surface surrounding the recess; removing the portion of the support layer that extends beyond the intermediate substrate; and detaching the transfer layer and support layer from its intermediate support to form the composite substrate. The support layer is made of a deposited material that has a lower quality than that of the intermediate support. A bonding layer may be included on one of the intermediate support or the useful layer, or both, to facilitate bonding of the layers. The final substrates are useful in optic, electronic, or optoelectronic applications.
REFERENCES:
patent: 4983251 (1991-01-01), Haisma et al.
patent: 5340753 (1994-08-01), Bassous et al.
patent: 5374564 (1994-12-01), Bruel
patent: 5966620 (1999-10-01), Sakaguchi et al.
patent: 6010579 (2000-01-01), Henley et al.
patent: 6100166 (2000-08-01), Sakaguchi et al.
patent: 6107213 (2000-08-01), Tayanaka et al.
patent: 6114188 (2000-09-01), Oliver et al.
patent: 6214701 (2001-04-01), Matsushita et al.
patent: 6326279 (2001-12-01), Kakizaki et al.
patent: 6346459 (2002-02-01), Usenko et al.
patent: 6420283 (2002-07-01), Ogawa et al.
patent: 6423614 (2002-07-01), Doyle
patent: 6521511 (2003-02-01), Inoue et al.
patent: 6774435 (2004-08-01), Matsumoto et al.
patent: 6878607 (2005-04-01), Inoue et al.
patent: 2003/0017712 (2003-01-01), Brendel
patent: 0 528 229 (1993-02-01), None
patent: 0 843 344 (1998-05-01), None
patent: 0 915 503 (1999-05-01), None
patent: 0 924 769 (1999-06-01), None
patent: 2 787 919 (2000-06-01), None
patent: 5-101998 (1993-04-01), None
patent: 9-115832 (1997-05-01), None
patent: 10-200080 (1998-07-01), None
patent: 11-026733 (1999-01-01), None
patent: 11-135882 (1999-05-01), None
patent: WO 98/52216 (1998-11-01), None
patent: WO 99/01899 (1999-01-01), None
patent: WO 99/41776 (1999-08-01), None
Ghyselen Bruno
Letertre Fabrice
Lee Hsien-ming
S.O.I.Tec Silicon on Insulator Technologies
Winston & Strawn LLP
LandOfFree
Semiconductor substrates having useful and transfer layers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor substrates having useful and transfer layers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor substrates having useful and transfer layers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4191187