Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-18
2010-11-23
Koval, Melissa J (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S758010
Reexamination Certificate
active
07839151
ABSTRACT:
A capacitor inspection device includes a substrate made of an insulating material, a first conductor unit and a second conductor unit arranged on the substrate, a signal input unit and a signal output unit attached to the substrate, a network analyzer and a pressurizing unit. The network analyzer has an input port connected to the signal input unit and an output port connected to the signal output unit. The first and second conductor units make contact with an anode and a cathode of a capacitor, respectively. The pressurizing unit presses the anode of capacitor onto the first conductor unit and the cathode onto the second conductor unit.
REFERENCES:
patent: 4075556 (1978-02-01), Seaman
patent: 5038100 (1991-08-01), Kushner et al.
patent: 5406211 (1995-04-01), Inoue et al.
patent: 5657207 (1997-08-01), Schreiber et al.
patent: 5821758 (1998-10-01), Jindal
patent: 6206937 (2001-03-01), Kudoh et al.
patent: 6294257 (2001-09-01), Tsukakoshi et al.
patent: 6489790 (2002-12-01), An et al.
patent: 2004/0174172 (2004-09-01), Kamitani
patent: 2006/0109609 (2006-05-01), Kobayashi et al.
patent: 2001-035759 (2001-02-01), None
patent: WO 00/04394 (2000-01-01), None
patent: WO 03/107365 (2003-12-01), None
Agilent Application Note AN 1287-9, In-Fixture Measurements Using Vector Network Analyzers, copyright1999, 2000, Agilent Technologies, Inc, Printed 8/00.
Agilent Application Note AN 1287-9, In-Fixture Measurements Using Vector Network Analyzers, copyright1999, 2000, Agilent Technologies, Inc, Printed 8/00 (Furnished in a previous office action).
Agilent LCR Meters, Impedance Analyzers and Test Fixtures Selection Guide, Copyright Agilent Technologiess, 2003, 2004, printed Feb. 4, 2005, pp. 10-16.
Higashitani Hiroshi
Kawahito Kazuo
Kurita Junichi
Yoshino Tsuyoshi
Baldridge Benjamin M
Koval Melissa J
McDermott Will & Emery LLP
Panasonic Corporation
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