Static information storage and retrieval – Floating gate – Disturbance control
Reexamination Certificate
2009-04-09
2010-11-16
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Floating gate
Disturbance control
C365S185040, C365S189070
Reexamination Certificate
active
07835178
ABSTRACT:
Some embodiments of the present invention provide a memory device including a first memory array having a first word line and a comparator circuit having a first terminal coupled to a reference voltage and a second terminal coupled to a first switch selectively coupling the first word line to a power source or the second terminal. In an embodiment, the reference voltage is selected for identifying a leakage condition associated with the first word line. In another embodiment, the first switch is configured to couple the first word line to the power source for a first predetermined period of time to allow charging of the first word line. In another embodiment, the first switch is configured to couple the first word line to the second terminal of the comparator for at least a second predetermined period of time.
REFERENCES:
patent: 5117426 (1992-05-01), McAdams
patent: 5359558 (1994-10-01), Chang et al.
patent: 6222768 (2001-04-01), Hollmer et al.
patent: 6768679 (2004-07-01), Le et al.
patent: 7023734 (2006-04-01), Chen
patent: 7272035 (2007-09-01), Chen et al.
patent: 7532513 (2009-05-01), Chen et al.
patent: 2008/0192545 (2008-08-01), Chen
Chen Han-Sung
Hsieh Ming-Chih
Hung Chun-Hsiung
Kuo Nai-Ping
Lo Su-Chueh
Macronix International Co. Ltd.
Nguyen Tuan T.
Townsend and Townsend / and Crew LLP
LandOfFree
Apparatus and method for detecting word line leakage in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for detecting word line leakage in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for detecting word line leakage in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4186740