Optical gap measuring apparatus and method

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Other Related Categories

356351, G01B 902

Type

Patent

Status

active

Patent number

055573991

Description

ABSTRACT:
Optical method and means for high-speed measurement of the distance between two surfaces, the first of which (25) is part of a substantially transparent element (20) and the second of which (35) is part of a test object (30). In a first step, a lens (3) directs a light beam (2) through a polarizing component (4) towards the first surface at an oblique angle of incidence. In a next step, the polarized light beam (5) reflects back through the transparent element by means of the combined effect of reflections from the first surface of the transparent element and from the surface of the test object (30). In a further step, a polarization-sensitive intensity detector (12) and a phase detector (13) measure the strength and relative phase of the polarization components defined by the plane of incidence. A computer (99) then analyzes these measured parameters to determine the size of the gap between the two surfaces (25,35). An additional method and means are provided to measure the complex index of refraction of the object surface (35) by changing the gap between the surfaces (25,35).

REFERENCES:
patent: 3855625 (1974-12-01), Garnler et al.
patent: 4593368 (1986-06-01), Fridge et al.
patent: 4606638 (1986-08-01), Sommargren
patent: 4762414 (1988-08-01), Grego
patent: 5170049 (1992-12-01), De Jonge et al.
patent: 5218424 (1993-06-01), Sommargren
patent: 5280340 (1994-01-01), Lacey
L-Y. Zhu et al., "Measurement Of Head/Disk Spacing With a Laser Interferometer," IEEE Transactions On Magnetics, vol. 24, No. 6, pp. 2739-2741, (Nov. 1988).
W. Stone, "A Proposed Method for Solving Some Problems in Lubrication," The Commonwealth Engineer, pp. 115-122 (Nov. 1, 1921).
R. Pavlat, "Flying Height Measurement Systems and Slider Absorption (k)," and other articles published in IDEMA Insight, vol. VII, No. 5, (Sep./Oct. 1994).
Y. Sato et al., "The Koyo FM2000 Fly Height Tester," IDEMA Sub 2-Microinch Fly Height Workshop Proceedings, pp. 31-44.
D. H. Veillard, "New Possibilities in Head-Disk Separation Movement," IDEMA Sub 2-Microinch Fly Height Workshop Proceedings, pp. 47-55.
C. Lacey, "A New Method for Measuring Flying Height Dynamically," IDEMA Sub 2-Microinch Fly Height Workshop Proceedings, pp. 59-74.
T. McMillan, "Ultra Low Flying Height Measurements Using Laser Interferometry and Fringe Intensity Determination," IDEMA Sub 2-Microinch Fly Height Workshop Proceedings, pp. 93-108.
G. L. Best, "Comparison Of Optical And Captive Measurements Of Slider Dynamics," IEEE Transactions on Magnetics, vol. MAG-23, No. 5, pp. 3453-3455, (Sep. 1987).
M. V. Mantravadi, "Chapter 1--Newton, Fizeau, and Haidinger Interferometers," Optical Shop Testing, Second Edition, pp. 1-48, John Wiley & Sons, Inc. (1992).
A. Nigam, "A Visible Laser Interferometer for Air Bearing Separation Measurement to Submicron Accuracy," Transactions of the ASME, vol. 104, pp. 60-65 (Jan. 1982).
T. Ohkubo et al., "Accurate Measurement of Gas-Lubricated Slider Bearing Separation Using Visible Laser Interferometry," Transactions of the ASME, vol. 110, pp. 148-155, (Jan. 1988).
G. L. Best, et al., "Precise Optical Measurement Of Slider Dynamics," IEEE Transactions on Magnetics, vol. MAG-22, No. 5, pp. 1017-1018 (Sep. 1986).
B. Bhushan, "Tribology and Mechanics of Magnetic Storage Devices," Springer-Verlag, pp. 765-797.
C. Lin, et al., "Real time interferometric ellipsometry with optical heterodyne and phase lock-in techniques," Applied Optics, vol. 29, No. 34, pp. 5159-5162 (Dec. 1990).
H. F. Hazebroek et al., "Interferometric ellipsometry," Journal of Physics E: Scientific Instruments, pp. 822-826, vol. 6 (1973).
T. Smith, "An Automated Scanning Ellipsometer," Surface Science, pp. 212-220, vol. 56, (1976).
R. F. Spanner, "Ellipsometry--A Century Old New Technique," Reprinted from Industrial Research, (Sep. 1975).
D. P. Pilipko et al., "Interference Ellipsometer," 8164 Instruments and Experimental Techniques, pp. 951-952, vol. 26, No. 4, Part 2 (Jul.-Aug. 1983).
C. Lacey et al., "Interferometric Measurement of Disk/Slider Spacing: The Effect of Phase Shift on Reflection," IEEE Transactions on Magnetics, vol. 29, No. 6, pp. 3906-3908 (Nov. 1993).
L. Singher et al., "Ellipsometry with a Stabilized Zeeman Laser," Applied Optics, vol. 29, No. 16, pp. 2405-2408 (Jun. 1990).
J. M. Fleischer et al., "Infrared Laser Interferometer for Measuring Air-Bearing Separation," IBM J. Res. Develop., pp. 529-533 (Nov. 1974).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical gap measuring apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical gap measuring apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical gap measuring apparatus and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-417410

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.