Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2007-06-08
2010-06-01
Jackson, Stephen W (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
07729094
ABSTRACT:
A method and a device are disclosed herein for protecting a circuit including a first terminal and a second terminal from electrostatic discharges. The device comprises at least one current path, wherein each current path of the at least one current path includes a transistor and a first circuit element. A first load terminal of the transistor is coupled to the first terminal of the circuit. A second load terminal of the transistor is coupled to a control terminal of the transistor and to a first terminal of the first circuit element. A second terminal of the first circuit element is coupled to the second terminal of the circuit. A well terminal of the transistor is coupled to the second terminal of the circuit via a second circuit element.
REFERENCES:
patent: 4630162 (1986-12-01), Bell et al.
patent: 5157573 (1992-10-01), Lee et al.
patent: 5946177 (1999-08-01), Miller et al.
patent: 6249410 (2001-06-01), Ker et al.
patent: 6646840 (2003-11-01), Sugerman et al.
patent: 6657836 (2003-12-01), He et al.
patent: 6927957 (2005-08-01), Bakulin et al.
patent: 7098510 (2006-08-01), Kodama et al.
patent: 2006/0250734 (2006-11-01), Kato
patent: 2008/0259511 (2008-10-01), Worley
patent: WO 02/37566 (2002-05-01), None
S. M. Sze, “Multiplication and Oxide Charging,” Chpt 8.4.4.Physics of Semiconductor Devices, John Wiley and Sons, New York: 1981. pp. 480-486.
Brooks Angela
Infineon - Technologies AG
Jackson Stephen W
Maginot Moore & Beck
LandOfFree
ESD protection circuit and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with ESD protection circuit and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ESD protection circuit and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4163009