Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-06-19
2010-02-16
Natalini, Jeff (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S679000, C327S100000
Reexamination Certificate
active
07663379
ABSTRACT:
A method of capacitance-to-voltage conversion with an external sensor capacitor (CP) and a capacitance-to-voltage converter (14) implemented on an integrated readout circuit that includes a reference capacitor (CR), a sampling capacitor (CS) and a sampling amplifier (22) and which has input terminals (16) to which the sensor capacitor (CP) is connected. The method comprises the steps of a) applying a reference voltage (Vref) to the series connected sensor capacitor (CP) and reference capacitor (CR) and charging the sampling capacitor (CS) to the potential at the interconnection node (A) between the sensor capacitor (CP) and the reference capacitor (CR), b) connecting the sampling capacitor (CS) to inputs of the sampling amplifier. The method further comprises the steps of c) applying the reference voltage (Vref) to the series connected sensor capacitor (CP) and reference capacitor (CR) with a polarity opposite to that in step a) and charging the sampling capacitor (CS) to the potential at the interconnection node (A) between the sensor capacitor (CP) and the reference capacitor (CR) and d) connecting the sampling capacitor (CS) to the inputs of the sampling amplifier in a polarity opposite to that in step b).
REFERENCES:
patent: 4404481 (1983-09-01), Ide et al.
patent: 6377056 (2002-04-01), Hanzawa et al.
patent: 6529015 (2003-03-01), Nonoyama et al.
patent: 2003/0062905 (2003-04-01), Kollmer et al.
patent: 28 19 516 (1978-11-01), None
patent: 101 09 873 (2001-09-01), None
patent: 10 2004 052034 (2005-06-01), None
J. Phys. E: Sci. Instrum 21 (1988) 242-250.
IEEE Transaction on Instrumentation and Measurement, vol. IM-35, No. 4, Dec. 1986, S. 472-476.
IEEE Transactions on Instrumentation and Measurement, vol. 38, No. 3, Jun. 1989, S 736-739.
IEEE Transactions on Instrumentation and Measurement, vol. 47, No. 1, Feb. 1998, S. 16-20.
IEEE Transactions on Instrumentation and Measurement, vol. 47, No. 1, Feb. 1998, S. 285-288.
IEEE Transactions on Instrumentation and Measurement, vol. 45, No. 2, Apr. 1996, S 531-540.
Ganz Rudiger
Nehrig Oliver
Brady III Wade J.
Kempler William B.
Natalini Jeff
Telecky , Jr. Frederick J.
Texas Instruments Deutschland GmbH
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