Semiconductor integrated circuit device operating frequency...

Details Semiconductor integrated circuit device operating frequency... Semiconductor integrated circuit device operating frequency...

2010-04-12

2010-12-21

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07855572

ABSTRACT:
A variation in manufacturing total costs is obtained by using an excessive loss amount caused by unnecessarily discarding elemental semiconductor integrated circuits occurring as a result of a negative result being obtained in an elemental test but a positive result obtained from a device test, and a short loss amount caused by packaging elemental semiconductor integrated circuits for semiconductor integrated circuit devices that are discarded as a result of a positive result being obtained from the elemental test but a negative result being obtained from the device test. A new operating frequency is determined by using the variation in manufacturing total costs with respect to an operating frequency.

REFERENCES:
patent: 7112979 (2006-09-01), Arabi et al.
patent: 7131041 (2006-10-01), Ozaki
patent: 7290183 (2007-10-01), Shimamura
patent: 7528622 (2009-05-01), Balog et al.
patent: 2005/0182587 (2005-08-01), Sato et al.
patent: 2006/0203423 (2006-09-01), Lee et al.
patent: 2003-4818 (2003-01-01), None
patent: 2003-43109 (2003-02-01), None
patent: 2005-83895 (2005-03-01), None
patent: 2005-257654 (2005-09-01), None
patent: 2006-253651 (2006-09-01), None
Noriyuki Ito et al., “Delay Defect Screening for a 2.16GHz SPARC64 Microprocessor”, Fujitsu Limited, Fujitsu laboratory, 0-7803-9451-8/06, 2006, IEEE, 4A-1, pp. 342-347.
International Search Report for PCT/JP2007/070462, mailed Jan. 22, 2008.

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