Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2008-12-04
2010-02-02
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S169000, C327S512000
Reexamination Certificate
active
07654736
ABSTRACT:
A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, a word line low voltage, or the like. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined.
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Jagan Mirellys
Verbitsky Gail
Walker Darryl G.
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