Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Phase comparison
Reexamination Certificate
2006-09-28
2010-10-26
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Phase comparison
C702S072000, C324S637000
Reexamination Certificate
active
07821249
ABSTRACT:
A phase difference measuring device according to this invention has an object of shortening the measuring time, and includes a plurality of phase difference measuring circuits (104, 105, 106) formed in a row, and phase difference conversion circuits (101, 102, 103) each connected between adjacent phase difference measuring circuits. The phase difference measuring circuit receives first and second signals, respectively gives the first and second signals first and second delay amounts cumulatively a plurality of number of times, and, whenever giving the delay amounts, compares the phases of the first and second signals given the delay amounts, thereby determining which one of the phases leads the other. The phase difference conversion circuit receives the first and second signals input to the phase difference measuring circuit in the preceding stage, respectively gives the first and second signals a first total delay amount (Tr1) as a total of the first delay amounts and a second total delay amount (Ts1) as a total of the second delay amounts given by the phase difference measuring circuit in the preceding stage, and outputs the first and second signals to the phase difference measuring circuit in the succeeding stage.
REFERENCES:
patent: 05-066236 (1993-03-01), None
patent: 06-098345 (1994-04-01), None
patent: 2000-111587 (2000-04-01), None
Abskharoun et al., “Circuit for On-Chip Sub-Nanosecond Signal Capture and Characterization”, IEEE Custom Integrated Circuits Conference 2001.
Weinlander et al., “An Eight Channel 36GSample/s CMOS Timing Analyzer”, IEEE International Solid-State Circuits Conference 2000.
Mota et al., “A High-Resolution Time Interpolator Based on a Delay Locked Loop and an RC Delay Line”, IEEE Journal of Solid-State Circuits, vol. 34, No. 10, Oct. 1999.
Mizuno Masayuki
Nose Koichi
Dole Timothy J
Hoque Farhana
NEC Corporation
Sughrue & Mion, PLLC
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