Semiconductor device including fuse and method for testing...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S705000

Reexamination Certificate

active

07629802

ABSTRACT:
Provided is a semiconductor device including a determination circuit adapted to determine whether a fuse is in a connection or disconnection state. The semiconductor device includes a first and second power supply terminals, a measuring terminal, and at least one trimming detection circuit connected between the measuring terminal and one of the first and second power supply terminals. The trimming detection circuit is constructed by a current supplying element, a series arrangement of a fuse and a switch element, and the determination circuit. The current supplying element and series arrangement are connected in series between the measuring terminal and the one of the first and second power supply terminals. The determination circuit has an input connected to a node between the current supplying element and series arrangement. A voltage at the other of the first and second power supply terminals is applied to the measuring terminal in a normal mode.

REFERENCES:
patent: 6307801 (2001-10-01), Ogawa et al.
patent: 2003/0006466 (2003-01-01), Kimura
patent: 2003/0090274 (2003-05-01), Kitade
patent: 1062477 (1998-03-01), None

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