Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-07-18
2009-06-02
Phung, Anh (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185110
Reexamination Certificate
active
07542353
ABSTRACT:
A flash memory device and an erase method thereof, in which the size of a memory cell block can be selectively changed during an erase operation. The flash memory device includes a plurality of memory cell blocks, an X-decoder, and a plurality of block selection units. The X-decoder decodes block address signals, page address signals, and block size change signals in response to one of a program command, a read command, and an erase command, generates a plurality of block selection signals and word line bias voltages according to the decoding result, and outputs the word line bias voltages to a plurality of global word lines, respectively. During the erase operation, the size of an erased memory cell block is decided according to word line bias voltages output from the X-decoder. During the erase operation, at least one of the plurality of block selection units selects at least one of the plurality of memory cell blocks. Accordingly, the size of a memory cell block of a flash memory device can be changed in various ways depending on operating characteristics of products.
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Hynix / Semiconductor Inc.
Lowe Hauptman & Ham & Berner, LLP
Phung Anh
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