Method for determination and evaluation of a shim parameter...

Electricity: measuring and testing – Particle precession resonance – Spectrometer components

Reexamination Certificate

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C324S319000

Reexamination Certificate

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07554327

ABSTRACT:
In a method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance (MR) apparatus, the shim device is set using a first shim parameter set, a first field distribution is measured in a body region encompassing a target volume from which MR data are to be acquired, a second shim parameter set is determined using an algorithm for optimization of the field homogeneity in the target volume on the basis of the first shim parameter set and dependent on the first field distribution, a second field distribution is determined on the basis of the second shim parameter set, and the shim parameter sets are evaluated by indirect or direct comparison of the first field distribution and the second field distribution, in particular in the target volume.

REFERENCES:
patent: 5006804 (1991-04-01), Dorri et al.
patent: 5373239 (1994-12-01), Marek et al.
patent: 6634088 (2003-10-01), Morrone
patent: 6714109 (2004-03-01), Rimkunas et al.
patent: 7215123 (2007-05-01), Axel
patent: 2006/0033494 (2006-02-01), Hennig et al.

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