Open-circuit testing system and method

Details Open-circuit testing system and method Open-circuit testing system and method

2007-05-02

2009-11-03

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S500000, C324S537000

Reexamination Certificate

active

07612568

ABSTRACT:
The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system comprises a signal sensing unit configured to provide a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin, a signal processor unit configured to filter and over-sample the sensed signal to obtain a digital signal, and an analyzer unit configured to compute the digital signal for determining a connection state of the test pin.

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