Method and device for evaluation of jointing regions on...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S108000, C219S602000, C219S612000, C219S097000, C348S061000, C348S086000, C348S090000

Reexamination Certificate

active

07577285

ABSTRACT:
A method and apparatus for detecting a joint between workpieces is provided. At least one light line is recorded by the light section method to detect the three-dimensional course of the joint and a grey-level image of the joint is also recorded. The grey-level image is evaluated to assess the quality of the joint.

REFERENCES:
patent: 3005912 (1961-10-01), Babcock
patent: 3345563 (1967-10-01), Wood
patent: 4242702 (1980-12-01), Kuni et al.
patent: 4305096 (1981-12-01), Yokoshima et al.
patent: 4306144 (1981-12-01), Masaki
patent: 4410787 (1983-10-01), Kremers et al.
patent: 4567347 (1986-01-01), Ito et al.
patent: 4567348 (1986-01-01), Smith et al.
patent: 4734766 (1988-03-01), Shiozumi et al.
patent: 4806732 (1989-02-01), Abshire et al.
patent: 4833381 (1989-05-01), Taft et al.
patent: 4849679 (1989-07-01), Taft et al.
patent: 4854724 (1989-08-01), Adams et al.
patent: 4863268 (1989-09-01), Clarke et al.
patent: 4877940 (1989-10-01), Bangs et al.
patent: 4922174 (1990-05-01), Pietrzak et al.
patent: 4951218 (1990-08-01), Okumura et al.
patent: 5038292 (1991-08-01), Okumura et al.
patent: 5039868 (1991-08-01), Kobayashi et al.
patent: 5040125 (1991-08-01), Okumura et al.
patent: 5078496 (1992-01-01), Parker et al.
patent: 5150175 (1992-09-01), Whitman et al.
patent: 5189514 (1993-02-01), Roden
patent: 5275327 (1994-01-01), Watkins et al.
patent: 5506386 (1996-04-01), Gross
patent: 5533146 (1996-07-01), Iwai
patent: 5614116 (1997-03-01), Austin et al.
patent: 5648619 (1997-07-01), Gustafsson et al.
patent: 5877960 (1999-03-01), Gross et al.
patent: 5978090 (1999-11-01), Burri et al.
patent: 6024273 (2000-02-01), Ludewig et al.
patent: 6049059 (2000-04-01), Kim
patent: 6175107 (2001-01-01), Juvinall
patent: 6204469 (2001-03-01), Fields et al.
patent: 6261701 (2001-07-01), Fields, Jr.
patent: 6299050 (2001-10-01), Okamura et al.
patent: 6403918 (2002-06-01), Fields et al.
patent: 6455803 (2002-09-01), Fields et al.
patent: 6476344 (2002-11-01), Fields et al.
patent: 6479786 (2002-11-01), Fields et al.
patent: 6545247 (2003-04-01), Mukasa et al.
patent: 6563575 (2003-05-01), Nichols et al.
patent: 6595403 (2003-07-01), Okamura et al.
patent: 6791057 (2004-09-01), Kratzsch et al.
patent: 6909462 (2005-06-01), Shinotsuka et al.
patent: 6909799 (2005-06-01), Wildmann et al.
patent: 6920238 (2005-07-01), Chen et al.
patent: 6937329 (2005-08-01), Esmiller
patent: 7268866 (2007-09-01), Messler
patent: 2002/0027155 (2002-03-01), Okamura et al.
patent: 2004/0026381 (2004-02-01), Tsukamoto et al.
patent: 44 08 226 (1994-03-01), None
patent: 43 12 241 (1994-10-01), None
patent: 10123057 (1998-05-01), None
patent: 10154014 (1998-06-01), None
patent: 2001287064 (2001-10-01), None
patent: WO 9944784 (1999-09-01), None
Eric C. Fox, Jerry Hynecek and Douglas R. Dykaar, “Wide-Dynamic-Range Pixel with Combined Linear and Logarithmic Response and Increased Signal Swing”, 2000, Proceedings of SPIE vol. 3965, pp. 4-10.
International Search Report for PCT/CH02/00613 dated Feb. 17, 2003.

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