Use of anti-reflective seed layers for the fabrication of...

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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C029S603130, C029S603150, C029S603180, C205S119000, C205S122000, C216S062000, C216S065000, C216S066000, C360S121000, C360S122000, C360S317000, C451S005000, C451S041000

Reexamination Certificate

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07631417

ABSTRACT:
Methods and structures for the fabrication of perpendicular thin film heads are disclosed. Prior to the deposition of shield structures, seed layers having anti-reflective properties are utilized, eliminating the need to deposit, then remove, traditional inorganic anti-reflection coatings prior to shield plating.

REFERENCES:
patent: 6876507 (2005-04-01), Chen et al.
patent: 6912106 (2005-06-01), Chen et al.
patent: 7097923 (2006-08-01), Webb et al.
patent: 2004/0264066 (2004-12-01), Shimizu et al.
patent: 2005/0068671 (2005-03-01), Hsu et al.
patent: 2005/0239001 (2005-10-01), Lee et al.
patent: 2005/0259355 (2005-11-01), Gao et al.
patent: 2006/0044681 (2006-03-01), Le et al.
patent: 2006/0174474 (2006-08-01), Le
patent: 2007/0258167 (2007-11-01), Allen et al.
patent: 2008/0110761 (2008-05-01), Lam et al.

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