Testing an electronic device using test data from a...

Details Testing an electronic device using test data from a... Testing an electronic device using test data from a...

2007-04-04

2009-06-16

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S763010

Reexamination Certificate

active

07548055

ABSTRACT:
A method and apparatus for testing a set of electronic devices can comprise placing electronic devices into a test station. A plurality of testers can provide test data to the test station. The test station can test the electronic devices using test data received from the plurality of testers. One of the testers can communication with another of the testers regarding the testing of the electronic devices. Probes can be used to contact the electronic devices, and one of the electronic devices can be contacted by more than one of the probes.

REFERENCES:
patent: 5225775 (1993-07-01), Sekino
patent: 5539325 (1996-07-01), Rostoker et al.
patent: 5621312 (1997-04-01), Achor et al.
patent: 5764655 (1998-06-01), Kirihata et al.
patent: 5825193 (1998-10-01), Nakata et al.
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6137303 (2000-10-01), Deckert et al.
patent: 6161205 (2000-12-01), Tuttle
patent: 6219810 (2001-04-01), Debenham
patent: 6236223 (2001-05-01), Brady et al.
patent: 6246251 (2001-06-01), Gallagher
patent: 6331782 (2001-12-01), White et al.
patent: 6759863 (2004-07-01), Moore
patent: 6820028 (2004-11-01), Ye et al.
patent: 6885202 (2005-04-01), Slupsky
patent: 7202687 (2007-04-01), Khandros et al.
patent: 7218094 (2007-05-01), Khandros et al.
patent: 7253651 (2007-08-01), Khandros et al.
patent: 2005/0086021 (2005-04-01), Khandros et al.
patent: 2005/0174131 (2005-08-01), Miller
patent: 2007/0210822 (2007-09-01), Khandros et al.
U.S. Appl. No. 11/835,151, filed Aug. 7, 2007, Khandros et al.

Affiliated with

Also associated with

Rating

Testing an electronic device using test data from a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing an electronic device using test data from a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing an electronic device using test data from a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4131193