Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-30
2009-11-03
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C399S021000, C399S046000, C399S048000
Reexamination Certificate
active
07612570
ABSTRACT:
A surface-potential distribution measuring apparatus includes an electron gun, an electron-beam optical system, an electron-emission panel, a detector, and a control system. The electron-beam optical system is located between the electron gun and a sample, and focuses a beam of electrons emitted from the electron gun to the surface of the sample. The electron-emission panel is located near the sample to be collided with at least part of the electrons via the sample, and emits secondary electrons corresponding to the number of collided electrons. The detector detects at least part of the secondary electrons. The control system obtains potential distribution on the surface of the sample based on a detection result obtained by the detector.
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U.S. Appl. No. 11/866,758, filed Oct. 3, 2007, Suhara.
Isla Rodas Richard
Nguyen Ha Tran T
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Ricoh Company Limited
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